Nikon CFI Plan Fluor DL 4X Phase Contrast Objective LWD-OBJECTIVE Non-contact semiconductor and wafer inspection

Non-contact semiconductor and wafer inspection

Multi-user core facility microscopes requiring reliable illumination coupling

Forensic and gemological analysis

or mounted specimens

revealing microstructural features

Nikon CFI Plan Fluor DL 4X Phase Contrast Objective LWD-OBJECTIVE Non-contact semiconductor and wafer inspectionNikon CFI Plan Fluor DL 4X Phase Contrast Objective a wide field, low magnification phase contrast objective ideal for specimen overview and navigation on Nikon CFI series microscopes. 4X magnification with Plan Fluor optical correction DL (Dark Low) phase contrast for high contrast specimen imaging Infinity corrected CFI optics Compatible with Nikon CFI series microscopes Condition: Excellent flawless optics University purchase orders accepted